Tesis profesional presentada por
Licenciatura en Ingeniería Mecatrónica. Departamento de Computación, Electrónica y Mecatrónica. Escuela de Ingeniería, Universidad de las Américas Puebla.
Jurado Calificador
Presidente: Dr. Jorge Rodríguez
Asomoza
Secretario y Director: M.C. Luis Gerardo Guerrero
Ojeda
Vocal y Co-director: Dr. Devata Venkata Bhyrava
Murthy
Suplente: Dr. Vicente Alarcón Aquino
Vocal: Dr. Roberto Rosas Romero
Cholula, Puebla, México a 11 de mayo de 2010.
Complex permittivities of the materials are evaluated at microwave frequencies by using the Substrate Integrated Waveguide (SIW) cavity resonator and Epsilon Near Zero (ENZ) technology.
Dielectric parameters such as dielectric constant and dielectric loss of solids samples, solvents and alcohols are determined by measuring the change in the resonant frequency and in the Q factor, due to the introduction of the samples in to these resonant structures.
High Frequency Structure Simulator (HFSS) has been used to design and optimize the resonant structures.
Simulations and measurements are performed with different substrates and different dielectric samples to validate the cavity perturbation theory using substrate integrated waveguide (SIW) cavity resonator.
For ENZ structure, simulations are performed with various height ratios to choose an optimized ratio that allows higher sensitivity.
Simulation and measurement results of cavity resonator and ENZ tunnel are in good agreement with theoretical values. Both structures present low profile, low cost, ease of fabrication and ease of integration, which adds important characteristics for portable material measurement systems.
Martínez Brito, J. 2010. Characterization of Dielectric Samples at Microwave Frequencies Using Substrate Integrated Waveguide Techniques. Tesis Licenciatura. Ingeniería Mecatrónica. Departamento de Computación, Electrónica y Mecatrónica, Escuela de Ingeniería, Universidad de las Américas Puebla. Mayo. Derechos Reservados © 2010.